Method and apparatus for double modulation spectroscopy

Details Method and apparatus for double modulation spectroscopy Method and apparatus for double modulation spectroscopy

G - Physics

01

J

73/55

G01J 3/28 (2006.01) G01J 3/433 (2006.01) G01N 21/27 (2006.01)

Patent

CA 1273819

METHOD AND APPARATUS FOR DOUBLE MODULATION SPECTROSCOPY ABSTRACT OF THE DISCLOSURE A spectroscopic technique in which the sample under investigation is probed with a generally monochro- matic beam of light which has been modulated at two distinct modulation frequencies. The double modulation produces a plurality of sidebands, and the two modula- tion frequencies are related to one another such that a selection of sidebands falls into two groups of closely spaced component sidebands. A first group is disposed in frequency at the spectral feature of interest and serves to probe the spectral feature. The other group is disposed in frequency remote from the feature and serves as a reference group. Within each group the component sidebands are offset from one another by a characteristic offset frequency, which can be consid- erably less than the width of the spectral feature under investigation. After interaction with the sample the doubly modulated beam is passed on to a photodetector, which in combination with appropriate signal processing apparatus detects a signal at the characteristic offset frequency representative of the spectral feature.

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