G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/90 (2006.01)
Patent
CA 2337294
A method for evaluation of an eddy current testing signal is provided. The method includes the steps of generating a feature amount based on a sample eddy current testing signal obtained by measuring a standard specimen, the feature amount including a feature highly correlated to a secondary factor which is other than a depth of the flaw and which affects the waveform of the signal; generating an evaluation parameter by using the feature amount, the evaluation parameter being a parameter for outputting a value with a sufficiently small error relative to correct answer data on the sample eddy current testing signal; and estimating the depth of a flaw, expressed by an actual measurement eddy current testing signal, by use of the evaluation parameter.
Asada Yoshihiro
Kawata Kayoko
Kurokawa Masaaki
Mitsubishi Heavy Industries Ltd.
Ogilvy Renault Llp/s.e.n.c.r.l.,s.r.l.
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