Method and apparatus for examining a work-piece

G - Physics – 01 – N

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73/51.5, 340/124

G01N 21/64 (2006.01) G01N 21/89 (2006.01)

Patent

CA 1167273

A B S T R A C T An automated system for examining a workpiece (6) that has been treated so that the flaws in it are revealed by concentrations of indicator on its surface to examine it for the presence of flaws, operates by scanning the surface of the workpiece (6) to provide an output signal representative of the luminance of regions of the surface of the workpiece (6),storing the output signals representative of the luminance of the regions of the workpiece in a memory (12),forming a first average signal representative of the average luminance of a number of regions (A,B,C) to one side of one region (D), forming a second average signal representative of the average luminance of a number of individual regions (E,F,G) to the other side of the one region (D),comparing the first and second average signals to determine which of the first and second signals indicates the greatest concentration of indicator, selecting whichever of these indicates the greater concentration of indicator and using it to derive a threshold value, comparing the derived threshold value with the output signal represen- tative of the luminance of the one region (D), and indi- cating that a flow is present in the workpiece (6) when the output signal representative of the luminance of the one region (D) indicates a greater concentration of indicator than does the threshold value. Using this technique of providing a variable threshold based on the highest average of the surroundings it is possible to achieve great selectivity in the examination of the work- piece (6) which takes account of differences in the background levels of indicator and enables automatic scanning of a workpiece (6) which is as sensitive as, or better than, the human eye and which is more reliable and consistent in its performance.

388050

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