Method and apparatus for faims for in-line analysis of...

Details Method and apparatus for faims for in-line analysis of... Method and apparatus for faims for in-line analysis of...

H - Electricity

01

J

H01J 49/10 (2006.01) B01D 57/00 (2006.01) B01J 19/12 (2006.01) G01N 27/62 (2006.01) G01N 27/64 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2493836

A method of separating ions includes providing a FAIMS analyzer region including an ion inlet orifice for providing ions thereto, and providing a sample holder along a side of the ion inlet orifice that is opposite the FAIMS analyzer. A sample material is applied to the sample holder such that sample material is disposed about first and second points along the sample holder, a distance between the first and second points being greater than a maximum dimension of the ion inlet orifice. The first point is aligned with the ion inlet orifice, and the sample material disposed about the first point is irradiated with laser light of a predetermined wavelength. Next, the sample holder is moved relative to the ion inlet so as to align the second point with the ion inlet orifice, and the sample material disposed about the second point is irradiated with laser light of a predetermined wavelength.

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