Method and apparatus for improved identification of probable...

Details Method and apparatus for improved identification of probable... Method and apparatus for improved identification of probable...

G - Physics

01

N

G01N 23/00 (2006.01) G01N 23/02 (2006.01) G01N 23/18 (2006.01) G01N 33/46 (2006.01)

Patent

CA 2235093

A method and apparatus for identifying-the probable existence and location of defects within a workpiece. The method segments the workpiece into a series of zones and scans the workpiece with an energy source and a detector array such as an x-ray source. For each zone scanned, a long-term average of density is determined and a moving average being a function of the average of density at the localized position and the long-term average is determined for localized positions. In this way, regional natural variations in the density of the workpiece bias the long-term average of the workpiece. The apparatus includes an energy source, a detector array, and a computer configured to implement the method. The apparatus preferably includes an x-ray device having a plurality of calibration shutters which can be used to perform multi-stage calibration of the detectors and the energy source.

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