G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 29/32 (2006.01) G01N 29/06 (2006.01) G01N 29/44 (2006.01) G06K 9/36 (2006.01) G06T 5/00 (2006.01)
Patent
CA 2694191
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.
L'invention concerne un procédé d'inspecter de composant. Le procédé consiste à générer une image du composant, un masque d'indication de signal ainsi qu'un masque de bruit utilisant un signal du masque d'indication de signal et facilitant la réduction de quantité de signaux prospectifs contenus dans le masque d'indication de signal ; à utiliser le masque d'indication de signal et le masque de bruit pour calculer le rapport signal sur bruit d'au moins une indication de défaut potentiel pouvant se trouver dans l'image.
Ferro Andrew Frank
Howard Patrick Joseph
Company General Electric
Craig Wilson And Company
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