Method and apparatus for inspecting components

Details Method and apparatus for inspecting components Method and apparatus for inspecting components

G - Physics

01

N

G01N 27/90 (2006.01)

Patent

CA 2353043

A method of inspecting a preselected area (16) of an electrically conductive component (10) to determine whether flaws (14) are present. The method includes the steps of permanently mounting an eddy current element (22) on the component (10) over the preselected area (16) and energizing the element (22) to generate alternating magnetic fields proximate the component (10). An electrical signal generated by a secondary magnetic field formed proximate the component (10) is detected using the element (22) and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw (14) in the component (10). Inspection apparatus (12) for performing this method is also disclosed.

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