Method and apparatus for interferometric deformation analysis

Details Method and apparatus for interferometric deformation analysis Method and apparatus for interferometric deformation analysis

G - Physics

03

H

73/77, 88/0.16

G03H 1/22 (2006.01) G01B 11/16 (2006.01)

Patent

CA 1112921

ABSTRACT OF THE DISCLOSURE To obtain a photographic record of an object surface having superimposed interference fringes arrayed as a function of the deformation which results in the object from an applied stress, which may be mechanical, thermal, or the like, the object is first illuminated with coherent light. The illuminated sur- face is then photographed with a camera having an optical wedge disposed over half of its lens to record two slightly displaced overlapping images of the object on the camera film. The object is then stressed by changing the ambient temperature or pressure or other mechanical loading, and the undeveloped film is exposed to a second set of overlapping images. The developed photograph contains a set of equal amplitude fringes representing the inter- ference pattern between the two fringe sets generated by the two exposures and arrayed as a function of the strain in the object as a result of the stress. To render the fringe set visible, an image of the object is projected on a screen through a Fourier, fringe-frequency sensitive filter which enhances the fringe contrast on the resulting image of the object.

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