G - Physics – 01 – B
Patent
G - Physics
01
B
354/25, 350/32,
G01B 11/24 (2006.01) G01B 11/25 (2006.01)
Patent
CA 1313040
ABSTRACT A method and apparatus for measuring a three-dimensional curved surface shape based on a new measuring principle that a surface of an object to bemeasured is coded with information relating to a slit light which is used as a medium and moved or rotated at a constant speed. The manner in which a linear reflected pattern of the slit light is moved over the surface of the object to be measured is picked up by a television camera to form a composite image in which a value of each of picture elements in the image is represented by information relating to the slit light, e.g., a position, time or projection angle of the slit light at an instant that the slit light passes through one of positions on the object surface corresponding to that picture element. Then, a difference in value between each corresponding picture elements of the composite image and another composite image formed similarly with respect to a reference plane is determined to measure a three-dimensional curved surface shape of the object to be measured.
579654
Inomata Masaichi
Komine Isamu
Uesugi Mitsuaki
Inomata Masaichi
Komine Isamu
Macrae & Co.
Nkk Corporation
Uesugi Mitsuaki
LandOfFree
Method and apparatus for measuring a three-dimensional... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring a three-dimensional..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring a three-dimensional... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1318708