Method and apparatus for measuring cathode emission slump

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324/2, 316/3

G01R 31/24 (2006.01) G01R 31/25 (2006.01)

Patent

CA 1103303

METHOD AND APPARATUS FOR MEASURING CATHODE EMISSION SLUMP Abstract A cathode ray tube, having a cathode and first, second and third grid electrodes, is biased "on" to allow an electron current Ik to flow from the cathode to the second and third grid electrodes. During a test period of predetermined length, the peak value of cathode current is stored as a reference measurement Ikp and the cathode current Ik is continuously monitored and compared with Ikp. A failure indication is provided if the magnitude of Ikp - Ik exceeds a predetermined value at any time during the test period.

299306

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for measuring cathode emission slump does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring cathode emission slump, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring cathode emission slump will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-378671

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.