Method and apparatus for measuring ellipse parameters of...

G - Physics – 01 – V

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G01V 3/12 (2006.01) G01V 3/10 (2006.01)

Patent

CA 1042075

METHOD AND APPARATUS FOR MEASURING ELLIPSE PARAMETERS OF ELECTROMAGNETIC POLARIZATION IN GEOPHYSICAL EXPLORATION. Abstract of the Disclosure: A method and apparatus for measuring ellipse parameters of polarization of an electromagnetic field are disclosed. A receiver is provided having crossed coils, and both the receiver and transmitter have specific orienta- tions which are set up whenever the receiver and transmitter are situated at any location for testing for the presence of an anomaly at least in the region of the receiver. When signals are detected on the crossed coils of the receiver, the receiver is maintained in its specific orientation while the signals from the crossed coils are examined at least so as to determine the phase difference quantity ? between the signals from the crossed coils and the magnitude ratio quantity r of those signals. With the quanti- ties ? and r, such ellipse parameters of polarization of the resultant EM field in the region of the receiver as the tilt angle, ellipticity angle and ellipticity ratio thereof can be determined by mathematical analysis and processing. In high noise situations, or where the signal level on either receiver coil is low, signal level stacking circuits are utilized to arithmetically add signal levels of succeeding signals until such time as one of the signals being stacked reaches a predetermined level.

254856

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