G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 23/00 (2006.01) G01R 31/26 (2006.01) G01R 31/28 (2006.01) G01R 31/30 (2006.01) G01R 31/3161 (2006.01)
Patent
CA 2341941
A method is provided for measuring harmonic load-pull for frequency multiplication to obtain a load impedance and a source impedance for which frequency multiplication performance of a frequency multiplication device is optimized. A fundamental frequency signal is supplied to a frequency multiplication device under test from a source measurement system that includes a source mechanical tuner for adjusting a fundamental source impedance of an input signal. A load impedance frequency is obtained at which multiplication performance of the frequency multiplication device is optimum from a load measurement system that includes a load mechanical tuner for adjusting a load impedance of a target even-order multiplied signal among harmonics included in signal output of the frequency multiplication device. Fundamental load impedance and even-harmonic load impedance are independently controlled by means of a mechanical tuner on the load side that includes a control device which functions as an open-ended stub that is one-quarter wavelength long at the fundamental frequency, and at its position satisfies a short-circuit condition with respect to the fundamental frequency signal. The control device controls a fundamental load impedance that in accordance with a position at which the stub is set determines an electrical angle from an output section of a device under test to a short-circuit point. The fundamental source impedance and even-harmonic source impedance are independently controlled by means of a source mechanical tuner that includes a control device that functions as a short-circuit stub that is a quarter wavelength long at the fundamental frequency, which satisfies a short-circuit condition with respect to even-order harmonics that include the second harmonic signal for controlling an even-harmonic source impedance that in accordance with a position at which the stub is set determines an electrical angle from an input section of a device under test to the short-circuit point.
Kiyokawa Masahiro
Matsui Toshiaki
G. Ronald Bell & Associates
National Institute Of Information And Communications Technology
Posts And Telecommunications Communications Research Laboratory Ministry Of Public Management
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