G - Physics – 01 – R
Patent
G - Physics
01
R
356/117
G01R 31/28 (2006.01) G01R 31/30 (2006.01) G06F 11/00 (2006.01)
Patent
CA 1275507
ABSTRACT OF THE INVENTION A circuit is disclosed for detecting manufacturing deficiencies in semi-conductor devices and selecting marketable chips. The present invention comprises a speed circuit to determine the speed at which a particular chip operates. The speed circuit is a small, self-contained circuit that may be placed on any type of semi-conductor chip. It includes an oscillator, a counter, and a control logic circuit. The speed circuit is coupled lo an external clock and a control processor. The external clock provides a benchmark against which the operation of the chip can by compared. The control processor uses the output of the speed circuit to compute the speed at which the semi-conductor device operates.
587585
Riches Mckenzie & Herbert Llp
Sun Microsystems Inc.
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