G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 11/02 (2006.01) A61B 3/103 (2006.01) G01J 9/00 (2006.01) G02B 26/08 (2006.01)
Patent
CA 2681960
An apparatus and method for measuring wavefront aberrations. The apparatus comprises a reflecting device (128) for reflecting selected portions of the wavefront (126), an imaging device (132) for capturing information related to the selected portions, and a processor (136) for calculating aberrations of the wavefront from the captured information. The method comprises reflecting selected portions of a wavefront (126) onto the imaging device (132), capturing information related to the selected portions, and processing the captured information to derive the aberrations.
Appareil et méthode de mesure des aberrations de front d'ondes. L'appareil comprend un dispositif de réflexion (128) de parties sélectionnées du front d'ondes (126), un dispositif d'imagerie (132) pour saisir les données concernant lesdites parties et un processeur (136) pour le calcul des aberrations de front d'ondes à partir des données saisies. La méthode comprend la réflexion des parties sélectionnées du front d'ondes (126) dans le dispositif d'imagerie (132), la saisie des données reliées aux parties en question, ainsi que le traitement des données saisies pour la déduction des aberrations.
Collins Michael J.
Davis Brett A.
Iskander Daoud R.
Roffman Jeffrey H.
Ross Denwood F. III
Johnson & Johnson Vision Care Inc.
Norton Rose Or S.e.n.c.r.l. S.r.l./llp
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