B - Operations – Transporting – 23 – K
Patent
B - Operations, Transporting
23
K
B23K 26/00 (2006.01) B23K 26/06 (2006.01) G01N 21/63 (2006.01)
Patent
CA 2251082
A method and apparatus for monitoring the quality of a laser process such as a laser welding process comprises monitoring the light emitted from the weld plasma above the surface of the workpiece irradiated by the laser beam. The intensity of the light emitted from the plasma is compared to a predetermined value of the light emission as determined under process and workpiece conditions that produce welds of acceptable quality. Variations of the monitored light intensity greater than a preselected value can be valuated as unacceptable welds. Such variations can be caused by changes in the laser beam power, the workpiece speed, laser focusing problems, insufficient shield gas flow, workpiece deformation and weld contamination. The process monitors the light emission for a selected range of wavelengths that correspond to the major emission peaks of the light spectrum. The method enables in-process control of laser processes.
Chou Mau-Song
Shih Christopher C.
Shirk Bryan W.
Gowling Lafleur Henderson Llp
Northrop Grumman Corporation
Trw Inc.
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