Method and apparatus for monitoring the surface profile of a...

G - Physics – 01 – B

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340/136, 354/25,

G01B 11/24 (2006.01) G01B 11/245 (2006.01)

Patent

CA 1307051

ABSTRACT OF THE DISCLOSURE: The present disclosure describes a method and an apparatus for monitoring the surface profile of a moving workpiece at different positions along this workpiece. The apparatus comprises at least one optical unit including a light projecting system for illuminating discrete points on a first surface of said workpiece by projecting more than one discrete coplanar light beams. Each discrete light beam is projected at a different angle of incidence. The optical unit also comprises a light detecting unit for imaging said illuminated points, and generating electrical signals indicative of the surface profile at different positions along the first surface. In a preferred embodiment the thickness of the workpiece can be evaluated by positionning optical units for monitoring the opposite profiles of the workpiece along its whole length.

559913

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