G - Physics – 01 – B
Patent
G - Physics
01
B
340/136, 354/25,
G01B 11/24 (2006.01) G01B 11/245 (2006.01)
Patent
CA 1307051
ABSTRACT OF THE DISCLOSURE: The present disclosure describes a method and an apparatus for monitoring the surface profile of a moving workpiece at different positions along this workpiece. The apparatus comprises at least one optical unit including a light projecting system for illuminating discrete points on a first surface of said workpiece by projecting more than one discrete coplanar light beams. Each discrete light beam is projected at a different angle of incidence. The optical unit also comprises a light detecting unit for imaging said illuminated points, and generating electrical signals indicative of the surface profile at different positions along the first surface. In a preferred embodiment the thickness of the workpiece can be evaluated by positionning optical units for monitoring the opposite profiles of the workpiece along its whole length.
559913
Cielo Paolo
Dufour Marc
Lamontagne Mario
Cielo Paolo
Dufour Marc
Lamontagne Mario
National Research Council Of Canada
Robic
LandOfFree
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