Method and apparatus for optically measuring crimp frequency

Details Method and apparatus for optically measuring crimp frequency Method and apparatus for optically measuring crimp frequency

G - Physics

01

N

354/21, 350/32,

G01N 21/17 (2006.01) G01B 11/02 (2006.01)

Patent

CA 1145157

ABSTRACT The primary crimp frequency of crimped material is optically measured by utilizing the pattern of light reflections produced by the waviness of the material. The material is illuminated from one end thereof with light striking the material at a shallow angle to produce a pattern of bright and shadowed areas on the material. The light pattern is scanned by a reticon camera and an amplitude modulated output signal corresponding to the light pattern is obtained. The frequency of the output signal is measured to provide an indication of crimp frequency.

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