Method and apparatus for opto-electronic built-in test

Details Method and apparatus for opto-electronic built-in test Method and apparatus for opto-electronic built-in test

G - Physics

01

M

G01M 11/00 (2006.01) G01R 31/28 (2006.01)

Patent

CA 2350718

A method and circuitry is provided to adapt VLSI built-in testing and self- testing to opto-electronic VLSI technology. This method facilitates the testing of lasers, laser drivers, receivers and photodiodes by extending the concepts of scan-chain testing and BER testing. The advantages of this method are most obvious for opto- electronic ASICs that have a large number of VCSELs arranged in a regular fashion, such as an array or a line. Quantitative and qualitative testing is performed with variations to the circuitry.

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