Method and apparatus for pattern recognition and detection

Details Method and apparatus for pattern recognition and detection Method and apparatus for pattern recognition and detection

G - Physics

06

K

354/57

G06K 9/46 (2006.01)

Patent

CA 1166357

ERIM-328 ABSTRACT OF THE DISCLOSURE Image analyzing apparatus and methods are disclosed for analyzing 3-dimensional as well as 2-dimensional images. The pixels of the 3-dimensional images may be represented by multi-valued digital data signals which are analyzed in one or more programmable neighborhood transformation stages. In the preferred embodiment, each stage is programmed with selected contribution values associated with each pixel in the neighborhood. The values of the data signals for each pixel are modified by these contribution values and the extreme value thereof, such as the maximum value, is selected as the transformation output of the stage.

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