Method and apparatus for photoinductive imaging

Details Method and apparatus for photoinductive imaging Method and apparatus for photoinductive imaging

G - Physics

01

R

324/3, 324/50

G01R 33/00 (2006.01) G01N 25/72 (2006.01) G01N 27/90 (2006.01) G01R 35/00 (2006.01)

Patent

CA 2021531

ABSTRACT OF THE DISCLOSURE A system for photoinductive imaging for flaw detection of materials and for calibrating eddy current probes includes positioning an eddy-current probe adjacent to a specimen to be analyzed or to be used as a calibration fixture. A source of thermal energy is modulated and focused to a localized area on the specimen. Thermal energy is then scanned across at least a portion of the detection area of the eddy-probe. The resulting signal from the eddy- current probe is recorded and can depict either thermal-influenced components of the specimen or the response pattern of the eddy-current probe. The record can therefore be used to image flaws or physical holes or shapes of the specimen or calibrate the eddy-current probe.

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