H - Electricity – 01 – J
Patent
H - Electricity
01
J
H01J 37/20 (2006.01)
Patent
CA 2543462
A coupon (100) for preparing a TEM sample holder (170) comprises a sheet of material (120) that includes a TEM sample holder form (170). There is at least one section of the sheet (120) connecting the TEM sample holder form (170) to other portions of the sheet (120). A TEM sample holder (170) is formed by cutting the TEM sample holder form (170) from the coupon in a press. The cutting joins the tip point (160) of a nano-manipulator probe tip (150) with the formed TEM sample holder (170). The tip point (160) of the probe (150) has a sample (140) attached for inspection in a TEM.
L'invention concerne un coupon (100) destiné à la préparation d'un porte-échantillon MET (170) comprenant une feuille (120) comportant une forme de porte-échantillon MET (170). Au moins une section de la feuille (120) relie la forme de porte-échantillon MET (170) à d'autres parties de la feuille (120). Pour former un porte-échantillon (170) MET, il suffit de découper à la presse la forme du porte-échantillon MET dans le coupon. La découpe permet de joindre la pointe (160) d'une sonde de nano-manipulation (150) au porte-échantillon MET (170). La pointe (160) de la sonde (150) peut recevoir un échantillon (140) destiné à être examiné dans un MET.
Kirby Eades Gale Baker
Omniprobe Inc.
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