Method and apparatus for statistical set point bias control

Details Method and apparatus for statistical set point bias control Method and apparatus for statistical set point bias control

G - Physics

05

B

341/110, 354/230

G05B 11/01 (2006.01)

Patent

CA 1333817

A process controller may incorporate statistical computations of the variance in the controlled vari- able. Statistical measures may then be used to offset the controller set point to maintain the controlled variable distribution in an acceptable specification zone. The statistical measures may be made automatically and continuously thereby obviating human intervention, while producing high quality, though statistically variable, process output. The statistical measures may be calculated specifically or generated by a weighted integration method.

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