Method and apparatus for testing a video display chip

Details Method and apparatus for testing a video display chip Method and apparatus for testing a video display chip

G - Physics

01

R

G01R 31/28 (2006.01) G11C 29/02 (2006.01) G01R 31/3185 (2006.01)

Patent

CA 2365956

A video chip (100) includes test circuitry for detecting opens and shorts. The circuitry includes a series-connected chain of transistors and a test register (122, 124). There is a circuit for the column lines (114) and for the row lines (112). A bit pattern is driven onto the column (114) or the row lines (112) and received in the corresponding test circuitry. The pattern is read out and compared against the input pattern to detect faulty lines.

Cette puce vidéo (100) comprend des circuits d'essai destinés à détecter les interruptions et les courts-circuits. Ces circuits comprennent une chaîne de transistors connectés en série ainsi qu'un registre d'essai (122, 124). Il existe un circuit pour les lignes de colonne (114) et un pour les lignes de rangée (112). Un motif de bit est piloté sur les lignes de colonne (114) ou de rangée (112) et reçu dans le circuit d'essai correspondant. Le motif est lu et comparé au motif entré, aux fins de détection de lignes défectueuses.

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