Method and apparatus for testing coins

Details Method and apparatus for testing coins Method and apparatus for testing coins

G - Physics

07

D

G07D 5/08 (2006.01) G07F 3/00 (1990.01)

Patent

CA 2081322

2081322 9117527 PCTABS00008 The resistance introduced into a tuned circuit (2) by the proximity of a coin (10) while it is moving past an inductor (4) of the circuit is determined by changing the amount of phase shift present in a feedback path (18 to 24) associated with the circuit and measuring the resulting change in frequency of oscillation, which is dependent upon the resistance in the tuned circuit.

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