Method and apparatus for testing crystal elements

Details Method and apparatus for testing crystal elements Method and apparatus for testing crystal elements

G - Physics

01

R

324/36

G01R 29/22 (2006.01)

Patent

CA 1087688

ABSTRACT OF THE DISCLOSURE A method and apparatus for determining anomalies in the frequency or admittance temperature characteristic of a piezoelectric crystal resonator by inserting a variable capacitance network in series with the crystal and electronically sweeping the value of the capacitance network by a control voltage applied thereto while the temperature remains constant and noting any abrupt change in the resonance frequency characteristic.

306579

Affiliated with

Also associated with

Rating

Method and apparatus for testing crystal elements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing crystal elements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing crystal elements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-562656