G - Physics – 01 – B
Patent
G - Physics
01
B
340/77
G01B 7/00 (2006.01) B23Q 1/00 (2006.01) G01B 7/012 (2006.01)
Patent
CA 1271820
ABSTRACT The present invention is directed to an apparatus and method of testing the operability of probes used in performing workpiece probing operations. According to the preferred embodiment of the present invention, the probe has a first circuit means for generating a first signal, the first signal inducing the probe to generate a second signal. A second circuit means is provided for receiving the second signal. The second circuit means is adapted to generate a third signal indicative of the operability of the probe when the second signal is received.
506324
Gte Valeron Corporation
Juengel Richard O.
Macrae & Co.
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