G - Physics – 01 – N
Patent
G - Physics
01
N
73/99
G01N 25/02 (2006.01) G01N 11/08 (2006.01) G01N 25/04 (2006.01) G01N 33/28 (2006.01)
Patent
CA 1046792
METHOD AND APPARATUS FOR THE CONTINUOUS AUTOMATIC ANALYSIS OF THE CRYSTALLIZATION POINT OF LIQUID SUBSTANCES ABSTRACT OF THE DISCLOSURE The method consists of passing the substance to be analyzed through a measuring circuit at a constant flow rate, the temperature therein being maintained at a value sufficiently below the assumed crystallization point of the substance. Heating means are provided along the flow path of the liquid substance in said circuit. The substance in the course of cooling is kept in contact with an isomorphous crystalline material. The heating means is automatically turned on and off respectively at two characteristic temperatures, which are detected by measuring the pressure drop or difference of pressure of the substance at the inlet and at the outlet of the measuring circuit, variations of the pressure drop being effected as a function of temperature. The values thus measured of the pressure drop are utilised as control data for respectively turning on and off the heating means when the tempera- ture of the substance at the outlet reaches one of its two characteristic values, the first corresponding to the crystallization temperature level, whilst the other corresponds to a temperature sufficiently above said crystallization point. The temperature of the substance at the outlet of the circuit is continuously recorded, which constitutes a value representing the crystallization point of the substance. The method and the apparatus are particularly useful for determining the crystallization point of benzene, of paraxylene or of orthoxylene automatically and continuously. -1-
248262
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