G - Physics – 01 – Q
Patent
G - Physics
01
Q
88/16
G01Q 10/06 (2010.01)
Patent
CA 1270132
A B S T R A C T Method and Atomic Force Microscope for Imaging Surfaces with Atomic Resolution A sharp point (5) is brought so close to the surface of a sample (4) to be investigated that the forces occurring between the atoms at the apex of the point (5) and those at the surface cause a spring-like cantilever (7) to deflect. The cantilever (7) forms one electrode of a tunneling microscope, the other electrode being a sharp tip (8). The deflection of the cantilever (7) provokes a variation of the tunnel current, and that variation is used to generate a correction signal which can be employ- ed to control the distance between said point (5) and the sample (4), in order, for example, to maintain the force between them constant as the point (5) is scanned across the surface of the sample (4) by means of an xyz-drive (3). In certain modes of operation, either the sample (4) of the cantilever (7) may be excited to oscillate in z-direction. If the oscillation is at the resonance frequency of the cantilever (7), the resolution is enhanced.
519172
International Business Machines Corporation
Saunders Raymond H.
LandOfFree
Method and atomic force microscope for imaging surfaces with... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and atomic force microscope for imaging surfaces with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and atomic force microscope for imaging surfaces with... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1260650