Method and device for analyzing texture

Details Method and device for analyzing texture Method and device for analyzing texture

G - Physics

01

N

358/6

G01N 23/20 (2006.01)

Patent

CA 1314335

Abstract of the Disclosure In analyzing the texture of rolled metal sheets and strips by means of X-rays or gamma-rays -that penetrate them, the total beam emitted by the source of radiation is divided by collima- tors into several component beams. Each component beam is aimed at a different angle at a component area of the sheet or strip being tested. The diffracted radiation that penetrates the sheet is analyzed in accordance with its energy distribution in detectors, and the results are processed in a computer.

603657

Affiliated with

Also associated with

Rating

Method and device for analyzing texture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for analyzing texture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for analyzing texture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1338126