Method and device for identifying designated materials in...

G - Physics – 01 – N

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G01N 23/06 (2006.01) G01N 23/04 (2006.01) G01N 23/08 (2006.01) G01V 5/00 (2006.01)

Patent

CA 2163884

The method comprises the following steps: first, the attenuation function over a wide spectrum of X-rays of at least three reference materials is determined and projection functions (FP1, FP2, FP3, FP4) forming a base are deduced therefrom; then, the attenuation function on said X-ray spectrum is determined for at least one test material and the attenuation function for each test material is projected on said base; for each point of the object (1), the attenuation function of the object (1) is determined on said X-ray spectrum, which attenuation function is projected on said base, the projections thus obtained being compared to the projections of each test material and, from said comparison, it is possible to deduce if at least one test material enters into the composition of the object (1), at the point considered. Application to the inspection and control of baggage.

Le procédé comporte les étapes suivantes: préalablement, on détermine la fonction d'atténuation sur un spectre large de rayons X d'au moins trois matériaux de référence et on en déduit des fonctions de projection (F P1, F P2, F P3, F P4) formant une base; et on détermine la fonction d'atténuation sur ledit spectre de rayons X d'au moins un matériau de test et on projette la fonction d'atténuation de chaque matériau de test sur ladite base; pour chaque point de l'objet (1), on détermine la fonction d'atténuation de l'objet (1) sur ledit spectre de rayons X, que l'on projette sur ladite base, on compare les projections ainsi obtenues aux projections de chaque matériau de test et on en déduit de cette comparaison si au moins un matériau de test entre dans la composition de l'objet (1), au point considéré. Application à l'inspection et au contrôle de bagages.

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