Method and device for measuring thickness of a substrate

Details Method and device for measuring thickness of a substrate Method and device for measuring thickness of a substrate

G - Physics

01

B

G01B 7/06 (2006.01) B65H 63/00 (2006.01)

Patent

CA 2688738

A gauge for measuring the thickness of a piece of steel or other ferromagnetic substrate. The gauge may be used to measure the wall thickness of tubing, a pipe, a shim, a plate, etc, given that it's made from a material that a magnet might be attracted to. The gauge uses a force sensor to measure the force between a magnet and the tubing, pipe, shim, plate, etc. Because different thicknesses correspond to a different magnitude of force, the gauge may be used to find flaws and variations in the material. The gauge may use a force sensor that is approved for use in or near flammable environments.

Affiliated with

Also associated with

Rating

Method and device for measuring thickness of a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for measuring thickness of a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring thickness of a substrate will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1914373