Method and device for use in dc parametric tests

Details Method and device for use in dc parametric tests Method and device for use in dc parametric tests

G - Physics

01

R

G01R 31/28 (2006.01) G01R 31/30 (2006.01) G01R 31/319 (2006.01)

Patent

CA 2384627

A system and device suitable for use in performing a DC parametric test on an unknown load is provided. The device may be configured to apply a desired voltage or current to the unknown load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the unknown load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and a load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point. The application of second voltage signal to the intermediate voltage point causes a change in either one of the voltage signal or the current signal at the output such that a signal approximating the forcing parameter signal is caused at the output. A current measuring circuit adapted for providing a measure of the current at the load suitable for use with a voltage generating circuit device is also provided

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