Method and system for determining process parameters

G - Physics – 01 – K

Patent

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Details

G01K 11/00 (2006.01) A23L 1/01 (2006.01) A23L 3/16 (2006.01) B01J 19/12 (2006.01) G01R 27/26 (2006.01)

Patent

CA 2583998

The present invention relates to a method and a system for determining a set of process parameters of a treatment unit in which unit a product is subjected to a temperature treatment, the method comprising: subjecting a product to an electromagnetic signal before, during and/or after a temperature treatment, wherein said electromagnetic signal is adapted to interact with said product dependent upon the dielectric constant distribution of said product, receiving an electro-magnetic signal which has interacted with said product, analysing the received electromagnetic signal in comparison with the transmitted electromagnetic signal and thereby determining a response being dependent upon the dielectric constant distribution of said product and based thereupon determine the temperature (distribution) or water content of the product, and analysing said temperature distribution or temperature of the product or products and based thereupon determining a set of process parameters for a temperature treatment in a treatment unit.

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