Method and system for mass analysis of samples

Details Method and system for mass analysis of samples Method and system for mass analysis of samples

G - Physics

01

N

G01N 27/62 (2006.01) H01J 49/10 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2555985

A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.

L'invention concerne un système et un procédé qui permettent d'analyser un échantillon. Ce système comprend une source d'ions et un déflecteur qui permettent de produire une pluralité de faisceaux d'ions, qui sont chacun détectés dans des régions de détection distinctes. Un système de détection utilise les informations obtenues de la région de détection afin d'analyser l'échantillon.

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