Method and system for measuring emission and quantifying...

G - Physics – 01 – W

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G01W 1/00 (2006.01) G01N 1/22 (2006.01)

Patent

CA 2758747

A system and method for quantifying an emission source is provided. The system and method obtain a plurality of emission concentration measurements at one or more sampling points and wind data over the time the emission concentrations are measured. For each sampling point, a virtual sampling arc can be constructed using the emission concentration measurements taken at the sampling point, the wind data for when the emission concentration measurement were taken and an approximate distance to the emission source. The virtual sampling arcs can then be used to construct one or more virtual sampling grids and the amount of emissions emanating from the emissions source approximated from the virtual sampling grids.

L'invention porte sur un système et sur un procédé pour quantifier une source d'émission. Le système et le procédé permettant d'obtenir une pluralité de mesures de concentration d'émission à un ou plusieurs points d'échantillonnage et des données de vent au cours du temps durant lequel les concentrations d'émission sont mesurées. Pour chaque point d'échantillonnage, un arc d'échantillonnage virtuel peut être construit à l'aide des mesures de concentration d'émission prises au point d'échantillonnage, des données de vent lorsque la mesure de concentration d'émission a été prise et d'une distance approximative par rapport à la source d'émission. Les arcs d'échantillonnage virtuels peuvent ensuite être utilisés pour construire une ou plusieurs grilles d'échantillonnage virtuelles et la quantité d'émissions émanant de la source d'émission approchée à partir des grilles d'échantillonnage virtuelles.

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