G - Physics – 01 – B
Patent
G - Physics
01
B
354/25, 358/5
G01B 11/06 (2006.01) G01B 21/08 (2006.01)
Patent
CA 2025380
RD-18,964 METHOD AND SYSTEM FOR PERFORMING WALL THICKNESS MEASUREMENTS ABSTRACT OF THE DISCLOSURE A method and system for performing wall thickness measurements from a cross-sectional image of a part is described. The invention comprises means for selecting a wall of the part whose thickness is to be measured, means for generating a wall profile signal from the cross- sectional image of the selected wall, means for approximating a decay parameter from the wall profile signal, and means for calculating the wall thickness of the selected wall from the approximated decay parameter and the wall profile signal.
Eberhard Jeffrey W.
Mitchell Kenneth W.
Thomas Lewis J. III
Company General Electric
Craig Wilson And Company
Eberhard Jeffrey W.
Mitchell Kenneth W.
Thomas Lewis J. III
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