Method and system for testing and calibrating an...

Details Method and system for testing and calibrating an... Method and system for testing and calibrating an...

G - Physics

01

P

G01P 21/00 (2006.01) H04W 88/02 (2009.01) G06F 15/02 (2006.01)

Patent

CA 2711406

A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is method of testing and calibrating an accelerometer of an electronic device, comprising: levelling a test fixture; placing the electronic device in a nest of the test fixture; detecting the electronic device within the nest; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.

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