Method & device for measuring profile without use of...

Details Method & device for measuring profile without use of... Method & device for measuring profile without use of...

G - Physics

01

B

G01B 21/20 (2006.01) G01B 5/004 (2006.01)

Patent

CA 2286939

A method for measuring surface profiles is disclosed, which does not require an accurate reference profile. A linear array of displacement sensors is used to measure data sets, from which a numerical approximation to 2nd or higher-order derivative is calculated, and the profile is then calculated by a numerical integration method. A device that measures profile by this method is also disclosed. This method and device is particularly useful for measuring profiles of long objects, including continuous rolled or extruded metal or plastic sections, where use of accurate reference profiles are impractical.

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