Method for advanced material characterization by laser...

G - Physics – 01 – N

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01N 27/14 (2006.01) G01N 25/72 (2006.01) G01N 27/00 (2006.01) G01N 27/90 (2006.01)

Patent

CA 2077462

GSC 13,386-1 CHERN ABSTRACT An improved NDE method utilizes a laser source with modulator and scanning mirror, a pancake shape eddy current detecting coil, a lock-in amplifier, a system controller, and an impedance gain/phase analyzer. The laser is directed by the scanning mirror to a specimen to be analyzed. A very localized or small area of the specimen is impacted directly by the laser beam creating a thermal and stress wave in the specimen. An impedance gain/phase analyzer is connected to the eddy current detecting coil and to a lock-in amplifier through the system controller. The lock-in amplifier is also synchronized to the laser modulator. The system controller is used to control the lock-in amplifier, scanning mirror, and to process data from the analyzer. Raster scanning of the laser beam across the specimen allows the detection by the coil of the laser generated thermal and elastic strains induced in the specimen by the laser. The rastering of the laser beam is controlled by the controller by positioning the mirror. 12

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method for advanced material characterization by laser... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for advanced material characterization by laser..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for advanced material characterization by laser... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1478163

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.