Method for analysing reflective properties

Details Method for analysing reflective properties Method for analysing reflective properties

G - Physics

01

N

G01N 21/47 (2006.01) B23K 26/00 (2006.01) G01N 21/898 (2006.01) G06T 17/40 (2006.01)

Patent

CA 2652637

The invention relates to a method for analysing and describing the reflective properties of a three-dimensionally structured original surface. According to said method, the topology of the original surface is determined and the topological data is stored in the form of a depth map in a first data record and is evaluated with respect to the influence of said data on the reflective properties. Each surface element is assigned a reflective value in accordance with said evaluation and the value is stored in a second data record and made available to other machining or inspection systems.

L'invention concerne un procédé permettant d'analyser et de décrire les propriétés de réflexion d'une surface originale de structure tridimensionnelle. Ce procédé consiste à déterminer la topologie de la surface originale et à enregistrer les données topologiques pour obtenir un premier enregistrement sous forme de carte de profondeurs, à évaluer lesdites données du point de vue de leur effet sur les propriétés de réflexion et, en fonction de leur effet, à associer une valeur de réflexion à chaque élément de surface, laquelle valeur est enregistrée sous la forme d'un second enregistrement et fournie à d'autres systèmes de traitement ou d'essai.

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