Method for analysis of a fused material device and dipping...

Details Method for analysis of a fused material device and dipping... Method for analysis of a fused material device and dipping...

G - Physics

01

N

G01N 21/69 (2006.01) C21C 5/46 (2006.01) G01N 21/85 (2006.01)

Patent

CA 2539844

The invention relates to a method and device for analysis of a fused material by optical emission spectroscopy, for example, a fused metal such as cast iron or steel, or a slag, a glass, or a lava. A sensing element with at least one emission spectrometer and at least one excitation device is used to generate the activation of the material for analysis and to permit the generation of a radiation for analysis in the spectrometer provided in the sensing element. Said sensing element is brought into contact with the fused material for analysis and transmits information, comprising analysis elements, provided by a spectrometer. The invention further relates to a dipping sensor.

L'invention concerne un procédé et un dispositif pour analyser une matière fondue par spectrométrie d'émission optique, par exemple un métal fondu, tel que de la fonte de fer, de l'acier, un laitier, un verre ou une lave. Selon ladite invention, un élément sensible, comprenant au moins un spectromètre d'émission et au moins un dispositif d'excitation, est utilisé pour induire l'excitation de la matière à analyser et pour permettre la production partielle ou complète d'un rayonnement destiné à être analysé par un spectromètre situé dans l'élément sensible. L'élément sensible susmentionné est mis en contact avec la matière fondue à analyser et transmet une information contenant des éléments d'analyse fournis par un spectromètre. Cette invention concerne également un capteur à immersion.

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