G - Physics – 01 – R
Patent
G - Physics
01
R
324/3
G01R 35/00 (2006.01) G01N 33/00 (2006.01)
Patent
CA 1102874
ABSTRACT OF THE DISCLOSURE A method for checking gas analysis devices in respect of their sensitivity and their response and regeneration behaviour with respect to time, wherein a reproducible quantity of the measurement component is produced at a predetermined production rate, for a period of time which is guided entirely or at a constant proportion as a concentration pulse to the measurement element of the gas analysis device. For the production of the measurement component a chemical or electro-chemical reaction or even a thermal reaction is used. The time interval can then be conveniently controlled. A decisive advantage with topic measurement components is that the gas production takes place in all cases for only a short time during the test procedure.
278333
Becker Wolf-Jurgen
Breuer Wolfram
Deprez Jacques
Drope Eckard
Kaufmann Karl-Heinz
Aktiengesellschaft Bayer
Fetherstonhaugh & Co.
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