Method for checking marks

Details Method for checking marks Method for checking marks

G - Physics

06

K

G06K 9/62 (2006.01) G06K 9/32 (2006.01) G06K 9/38 (2006.01)

Patent

CA 2051613

ABSTRACT OF THE DISCLOSURE A method for checking a mark comprises the steps of: converting an image signal for pixels to digital signals each corresponding to densities, detecting a maximum value and a minimum value, respectively, of image signal densities of a noted pixel and one or more pixels around the noted pixel, binary converting the noted pixel using a threshold selected as a medium value between the maximum and minimum values detected, extracting respective characteristic quantities of a plurality of independent patterns which are separate from each other in a standard image; defining a relative coordinate system based on respective positions of center of gravitation of two independent patterns which can be defined by different characteristic quantities; registering respective positions of center of gravitation of and respective characteristic quantities of the plurality of independent patterns, respectively, in the relative coordinate system; collating the independent patterns in the objective image with the independent patterns in the standard image; and comparing characteristic quantities between corresponding patterns to discriminate defects of the mark, if any.

Affiliated with

Also associated with

Rating

Method for checking marks does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for checking marks, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for checking marks will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1775313