G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/90 (2006.01)
Patent
CA 2711168
A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.
L'invention concerne un procédé d'inspection d'un composant au moyen d'une sonde à courant de Foucault (ECAP). Le procédé comprend le balayage d'une surface du composant avec l'ECAP, le recueil, avec l'ECAP, d'une pluralité de réponses de défaut partiel, le transfert de la pluralité de réponses de défaut partiel à un processeur, la modélisation de la pluralité de réponses de défaut partiel comme des fonctions mathématiques sur la base d'une configuration d'éléments de l'ECAP et/ou d'une résolution des éléments, et la production d'une seule réponse de défaut maximal à partir de la pluralité de réponses de défaut partiel.
Dewangan Sandeep
Gambrell Gigi
Korukonda Sanghamithra
Mcknight William Stewart
Pisupati Preeti
Company General Electric
Craig Wilson And Company
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