Method for deep and vertical dry etching of sio2

H - Electricity – 01 – L

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

H01L 21/461 (2006.01) H01L 21/311 (2006.01)

Patent

CA 2349032

A method of etching SiO2 to produce vertical sidewalls is disclosed wherein the process is carried out at a high etch rate, using low energy ion bombardment, using C4F8 as a main etchant gas, and controlling the SiO2 sidewall profiles using the temperature of the sample.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method for deep and vertical dry etching of sio2 does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for deep and vertical dry etching of sio2, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for deep and vertical dry etching of sio2 will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1403677

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.