G - Physics – 06 – F
Patent
G - Physics
06
F
G06F 17/30 (2006.01) G06F 9/46 (2006.01)
Patent
CA 2347495
A method for comparing a first model (100) and a second model (150). The method includes identifying metadata in the first model (100) and in the second model (150) and calculating a first set of signatures for objects of the metadata of the first model (100) and a second set of signatures for objects of the metadata of the second model (150). The objects of the first model (100) and the objects of the second model (150) corresponding with each other have the same signatures. The method also includes determining which signatures of the first set of signatures match signatures of the second set of signatures. The method also includes determining for the matching signatures, whether the objects associated with the signatures of the first set of signatures equal the objects associated with the signatures of the second set of signatures.
Procédé de comparaison d'un premier modèle et d'un second modèle. Le procédé consiste à identifier des métadonnées dans le premier modèle et dans le second modèle et à calculer un premier ensemble de signatures pour des objets des métadonnées du premier modèle puis un second ensemble de signatures pour des objets des métadonnées du second modèle. Les objets du premier modèle et les objets du second modèle correspondant les uns aux autres ont les mêmes signatures. Le procédé consiste également à déterminer les signatures du premier modèle de signature correspondant aux signatures du second ensemble de signatures. Le procédé consiste aussi à déterminer pour les signatures correspondantes si les objets associés aux signatures du premier ensemble de signatures sont égaux aux objets associés aux signatures du second ensemble de signatures.
Deffler Tad A.
Kosowski Alexander
Nanduri Sastry
Computer Associates Think Inc.
Ridout & Maybee Llp
LandOfFree
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