C - Chemistry – Metallurgy – 23 – F
Patent
C - Chemistry, Metallurgy
23
F
148/27
C23F 1/00 (2006.01) C09K 13/10 (2006.01) C23F 4/00 (2006.01) H01L 21/3213 (2006.01)
Patent
CA 1116986
METHOD FOR DRY-ETCHING ALUMINUM AND ALUMINUM ALLOYS Abstract of the Disclosure The specification discloses a method for dry-etching A? and A? alloys. The etching method involves producing a plasma discharge in a mixed gas comprising boron trichloride and freon or other source of fluorine in the discharge and/or oxygen incorporated therein and patterning A? or an A? alloy by the produced discharge. In this dry etching method, the etch rate of A? or an A? alloy can be remarkably improved over the etch rate attainable according to the conventional techniques, and the difference of the etch rate between A? or an A? alloy and other materials can be remarkably increased. The patterned A? or A? alloys thereby produced can be used in the production of semiconductor devices.
328768
Iida Shinya
Komatsu Hideo
Mizutani Tatsumi
Ueki Kazuyoshi
Hitachi Ltd.
Kirby Eades Gale Baker
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