G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 13/00 (2006.01) G01M 99/00 (2011.01) G01M 13/02 (2006.01)
Patent
CA 2378440
A method of monitoring the condition of apparatuses wherein the condition of the apparatus is measured from one or more rotating objects by means of a fixedly mounted condition monitoring system during the operation of the apparatus when it operates at its normal operating speed. In the method, at least one signal indicating the condition of the apparatus and the steadiness of the operation is measured during the change in the operating speed of the apparatus and that desired characteristic values and/or functions are calculated from each signal measured in this manner as a function of measured time and/or rotational speed, which possibly helps to detect anticipating variations.
La présente invention concerne un procédé permettant de surveiller l'état d'appareils, l'état d'un appareil étant mesuré sur la base d'un ou plusieurs objets rotatifs au moyen d'un système de surveillance d'état monté fixe, alors que l'appareil fonctionne à une vitesse de fonctionnement normale. Selon le procédé, on mesure au moins un signal indiquant l'état de l'appareil et la régularité du fonctionnement pendant le changement de vitesse de fonctionnement de l'appareil et on calcule des valeurs et/ou fonctions caractéristiques désirées à partir de chaque signal mesuré de la sorte comme une fonction du temps mesuré et/ou de la vitesse de rotation, ce qui permet de faciliter la détection et l'anticipation des variations.
Metso Paper Automation Oy
Sim & Mcburney
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