Method for fabricating group iii nitride compound...

H - Electricity – 01 – L

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H01L 21/205 (2006.01) H01L 21/20 (2006.01) H01S 5/343 (2006.01) H01L 33/00 (2006.01)

Patent

CA 2397219

A first Group III nitride compound semiconductor layer 31 is etched, to thereby form an island-like structure such as a dot-like, stripe-shaped, or grid-like structure, so as to provide a trench/post. Thus, a second Group III nitride compound layer 32 can be epitaxially grown, vertically and laterally, from a top surface of the post and a sidewall/sidewalls of the trench serving as a nucleus for epitaxial growth, to thereby bury the trench and also grow the layer in the vertical direction. In this case, propagation of threading dislocations contained in the first Group III nitride compound semiconductor layer 31 can be prevented in the upper portion of the second Group III nitride compound semiconductor 32 that is formed through lateral epitaxial growth. As a result, a region having less threading dislocations is formed at the buried trench.

L'invention concerne une première couche semi-conductrice (31) de nitrure du groupe III, gravée en îlots à motifs en pointillés, à rayures, ou en damier de façon à former des niveaux. Une seconde couche semi-conductrice (32) de nitrure du groupe III peut se développer de façon épitaxiale verticalement et horizontalement sur les parties supérieures des niveaux supérieurs et les côtés servant de noyaux de la croissance destinéé à remplir les niveaux. Toute dislocation des fils dans la couche semi-conductrice (31) de nitrure du groupe III est supprimée pour être déplacée dans la partie supérieure horizontale développée de façon épitaxiale de la couche semi-conductrice (32) de nitrure du groupe III. Une région dans laquelle les dislocations des fils sont peu courantes peut ainsi être formée dans les niveaux remplis.

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