Method for improving signal-to-noise for multiply charged ions

Details Method for improving signal-to-noise for multiply charged ions Method for improving signal-to-noise for multiply charged ions

H - Electricity

01

J

H01J 49/02 (2006.01) H01J 49/06 (2006.01) H01J 49/26 (2006.01)

Patent

CA 2237255

A method of improving the signal-to-noise using first and second mass spectrometers in tandem, with an ion detector and data system coupled to the second mass spectrometer, comprising selecting precursor ions with the first mass spectrometer, at least some of the parent ions being multiply charged, colliding or reacting the precursor ions in an intermediate chamber so that multiply charged parent ions produce product ions which have at least one fewer charge than the multiply charged precursor ions, and using the second mass spectrometer or the ion detector and data system to allow only those ions which have an m/z value higher than the multiply charged precursor ions to be recorded for analysis by the ion detector and data system, so that only a signal due to multiply charged precursor ions is obtained in said data system.

Affiliated with

Also associated with

Rating

Method for improving signal-to-noise for multiply charged ions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for improving signal-to-noise for multiply charged ions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for improving signal-to-noise for multiply charged ions will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1394684